J.A. Woollam
Alpha-SE
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds.
Specification
| Ellipsometer Configuration | RCE |
| Wavelength Range | 380-900 nm |
| Number of Wavelengths | 180 |
| Detector | CCD |
| Angles of Incidence | 65°, 70°, 75° or 90° (straight-through) |
| Data Acquisition Rate (Complete Spectrum) | 3 sec. – Fast mode 10 sec. – Standard mode 30 sec. – High-precision mode |
Max substrate thickness | 16mm |
Product Models
| # | Image | Model Name | Detail |
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